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Advanced Materials Characterization
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About the book
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
| Author | Ch Sateesh Kumar |
|---|---|
| Publisher | Taylor & Francis Ltd |
| Published | 2024 m. |
| Language | English |
| Pages | 130 psl. |
| Format | Paperback |
| ISBN | 9781032375113 |
