{"product_id":"advanced-materials-characterization-taylor-francis-ltd-9781032375106-basic-principles-novel-applications-and-future-directions-ch-sateesh-kumar","title":"Advanced Materials Characterization","description":"\u003cp\u003eThe book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.\u003c\/p\u003e","brand":"Ch Sateesh Kumar","offers":[{"title":"Default Title","offer_id":52280891605334,"sku":"9781032375106","price":151.56,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781032375106.jpg?v=1767826432","url":"https:\/\/www.bookshop.lt\/products\/advanced-materials-characterization-taylor-francis-ltd-9781032375106-basic-principles-novel-applications-and-future-directions-ch-sateesh-kumar","provider":"Bookshop","version":"1.0","type":"link"}