{"product_id":"high-resolution-x-ray-diffractometry-and-topography-taylor-francis-ltd-9780367400637-d-keith-bowen","title":"High Resolution X-Ray Diffractometry And Topography","description":"\u003cp\u003e\u003cstrong\u003eHigh Resolution X-Ray Diffractometry And Topography\u003c\/strong\u003e by D. Keith Bowen, Brian K. Tanner.\u003c\/p\u003e\n\u003cp\u003ePublished by Taylor \u0026amp; Francis Group, (2019), Paperback, 264 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: X-ray crystallography, X-rays, diffraction, Crystals.\u003c\/p\u003e","brand":"D. Keith Bowen","offers":[{"title":"Default Title","offer_id":52240353362262,"sku":"9780367400637","price":84.87,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780367400637.jpg?v=1767762776","url":"https:\/\/www.bookshop.lt\/products\/high-resolution-x-ray-diffractometry-and-topography-taylor-francis-ltd-9780367400637-d-keith-bowen","provider":"Bookshop","version":"1.0","type":"link"}