{"product_id":"spectroscopic-ellipsometry-and-reflectometry-john-wiley-sons-inc-9780471181729-a-user-s-guide","title":"Spectroscopic Ellipsometry and Reflectometry","description":"\u003cp\u003eDiscover the cutting-edge world of thin film analysis with \"Spectroscopic Ellipsometry and Reflectometry,\" published by John Wiley \u0026amp; Sons Inc in 1999. This essential hardback text spans 248 pages, offering a thorough introduction to the increasingly popular method of spectroscopic ellipsometry. As an evolution of single wave ellipsometry, it has established itself as a leading technique for accurately measuring the thickness and optical properties of thin films.\u003c\/p\u003e \n\n\u003cp\u003eAuthored by experts in the field, this book serves as a practical guide, making complex concepts accessible to both beginners and experienced practitioners. Whether you are a student, researcher, or industry professional, you will find valuable insights that bridge theory and application. Don't miss the opportunity to enhance your understanding of these pivotal optical measurement techniques!\u003c\/p\u003e","brand":"Bookshop","offers":[{"title":"Default Title","offer_id":52228035346774,"sku":"9780471181729","price":189.09,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780471181729.jpg?v=1767742678","url":"https:\/\/www.bookshop.lt\/products\/spectroscopic-ellipsometry-and-reflectometry-john-wiley-sons-inc-9780471181729-a-user-s-guide","provider":"Bookshop","version":"1.0","type":"link"}