Defects in Microelectronic Materials and Devices

Explore the intricate world of microelectronics with Defects in Microelectronic Materials and Devices by Daniel Fleetwood. Published by Taylor & Francis Inc in 2008, this comprehensive hardback spans an impressive 770 pages, offering an in-depth survey of defects in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies.

Delve into the complexities of flaws found in linear bipolar technologies, as well as silicon carbide-based devices and gallium arsenide materials. This essential resource is ideal for professionals and students alike, providing critical insights into microelectronics, materials testing, and nanotechnology. Whether you're involved in integrated circuits or material science, this book presents valuable knowledge to enhance your understanding of defects in microelectronic materials and devices.