Book cover of: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Book cover of: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Devices, Circuits, and Systems

€221,00 €287,30
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259 psl.

2013 m.

Kietas viršelis

Brūkšninis kodas: 9781439829417
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