• Book cover of: Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

Chicago) Browning Nigel D. (University of Illinois

€54,35
€54,35 €56,50 Išpardavimas

Turime sandėlyje

Prekės šiuo metu neturime
Palikite el. paštą ir pranešime iškart, kai prekė vėl atsiras sandėlyje.
Viršelis
Minkštas viršelis · Šis leidimas €54,35Pristatymas 3-4 sav.
Characterization of High Tc Materials and Devices by Electron Microscopy Kietas viršelis €164,69Pristatymas 3-4 sav.
Kalba Anglų k.
Leidimo metai 2006 m.
Puslapių skč. 408 psl.
Viršelis Minkštas viršelis
ISBN 9780521031707

Characterization of High Tc Materials and Devices by Electron Microscopy

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.

Book cover of: Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials...

€54,35
€54,35 €56,50