• Book cover of: Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

Chicago) Browning Nigel D. (University of Illinois

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Kietas viršelis · Šis leidimas €164,69Pristatymas 3-4 sav.
Characterization of High Tc Materials and Devices by Electron Microscopy Minkštas viršelis €54,35Pristatymas 3-4 sav.
Kalba Anglų k.
Leidimo metai 2000 m.
Puslapių skč. 406 psl.
Viršelis Kietas viršelis
ISBN 9780521554909

Characterization of High Tc Materials and Devices by Electron Microscopy

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.

Book cover of: Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials...

€164,69
€164,69 €170,25